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MONITEUR A EMISSION SECONDAIRE POUR LA POSITION ET L'INTENSITE D'UN FAISCEAU D'ELECTRONS ACCELERESPRUDNIKOV IA; TOROPOV AS; CHICHIKALOV YU F et al.1973; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1973; NO 1; PP. 24-26; BIBL. 5 REF.Serial Issue

CARACTERISTIQUES EXPERIMENTALES D'UN MONITEUR A EMISSION SECONDAIRE POUR UN FAISCEAU D'ELECTRONS ACCELERESANGELOV BP; PRUDNIKOV IA; SHCHEPIN YU P et al.1972; PRIBORY. TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 3; PP. 23-24; BIBL. 6 REF.Serial Issue

SCHEMA POUR PRODUIRE DES SERIES D'IMPULSIONS DE DIFFERENTES POLARITES ET DE FAIBLE DUREEKOLOTOV OS.1972; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1972; NO 4; PP. 125-126; BIBL. 4 REF.Serial Issue

SYSTEMES DE POMPAGES D'ULTRAVIDE POUR MICROSCOPES ELECTRONIQUES EMISSIFSISAEV AA.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 9; PP. 1957-1960; BIBL. 17 REF.Serial Issue

THE EFFECTS OF OXYGEN ADSORPTION ON THE POSITIVE SECONDARY ION YIELD OF STAINLESS STEELSCHUBERT R.1974; J. VACUUM SCI. TECHNOL.; U.S.A.; DA. 1974; VOL. 11; NO 5; PP. 903-905; BIBL. 15 REF.Article

FURTHER STUDY OF THE ANOMALOUS BEHAVIOR OF SECONDARY PARTICLES EMITTED FROM HEAVY PRIMARY INTERACTIONSJUDEK B.1972; CANAD. J. PHYS.; CANADA; DA. 1972; VOL. 50; NO 18; PP. 2082-2095; ABS. FR.; BIBL. 22 REF.Serial Issue

OPTIMUM CONDITIONS FOR SEAM TRACKING IN ELECTRON BEAM WELDING USING SECONDARY EMISSION = CONDITIONS OPTIMALES DU SUIVI DE JOINT BASE SUR L'EMISSION D'ELECTRONS SECONDAIRES EN SOUDAGE PAR FAISCEAU D'ELECTRONSPROZOROVSKIJ AI; LESKOV GI.1980; AUTOMAT. WELDG.; ISSN 0005-108X; GBR; DA. 1980; VOL. 33; NO 11; PP. 24-26; BIBL. 4 REF.; DE RUS; LOC. IS;[AVTOM. SVARKA; UKR; DA. 1980; NO 11; PP. 30-32]Article

NON DESTRUCTIVE TESTING BY ELECTRON EMISSION (REVIEW)IVANOV VI.1980; DEFEKTOSKOPIJA; ISSN 0130-3082; SUN; DA. 1980; NO 5; PP. 65-84; BIBL. 37 REF.Article

CANON IONIQUE ET ILLUMINATEUR U.V. V.V. POUR UN MICROSCOPE EMISSIFKAGAN NB; KUSHNIR YU M; ROZENFEL'D LB et al.1972; IZVEST. AKAD. NAUK S.S.S.R., SER. FIZ.; S.S.S.R.; DA. 1972; VOL. 36; NO 9; PP. 1932-1936; BIBL. 3 REF.Serial Issue

BREVET 2.140.049 (B) (7219159). A 29 MAI 1972. PROCEDE PERMETTANT DE TRAITER UN CORPS EN VERRE AFIN D'EN REGLER LA CONDUCTIVITE ELECTRIQUEsdPatent

SECONDARY ELECTRON EMISSION FROM A FE (110) SINGLE CRYSTALKOSHIKAWA T; SHIMIZU R; GOTO K et al.1973; J. APPL. PHYS.; U.S.A.; DA. 1973; VOL. 44; NO 4; PP. 1900-1901; BIBL. 9 REF.Serial Issue

1-17 KEV POSITIVE-ION-INDUCED ELECTRON EJECTION FROM TUNGSTEN, MOLYBDENUM AND VANADIUM.COOK N; BURTT RB.1975; J. PHYS. D; G.B.; DA. 1975; VOL. 8; NO 7; PP. 800-811; BIBL. 12 REF.Article

SIGNAL DETECTION OF ROTATIONAL PROCESSES AND FREQUENCY DEMODULATION.TING HO LO J.1974; INFORM. AND CONTROL; U.S.A.; DA. 1974; VOL. 26; NO 2; PP. 99-115; BIBL. 15 REF.Article

SECONDARY ELECTRON CONDUCTION CAMERA TUBE FOR SPACE APPLICATIONS.KUNZE C; SAMUELSSON H.1976; APPL. OPT.; U.S.A.; DA. 1976; VOL. 15; NO 3; PP. 661-667; BIBL. 10 REF.Article

ETUDE EXPERIMENTALE DE L'EMISSION ELECTRONIQUE SECONDAIRE DE L'ALUMINIUM ET DE L'ARGENTROPTIN D.1975; AO-CNRS-12141; FR.; DA. 1975; PP. 1-97; BIBL. 5 P.; (THESE DOCT.-ING.; NANTES)Thesis

ANGULAR-RESOLVED SECONDARY-ELECTRON-EMISSION SPECTRA FROM TUNGSTEN SURFACES.WILLIS RF.1975; PHYS. REV. LETTERS; U.S.A.; DA. 1975; VOL. 34; NO 11; PP. 670-674; BIBL. DISSEM.Article

SPECTROGRAPHIE DE MASSE AVEC SOURCE A EMISSION IONIQUE SECONDAIREHERNANDEZ R; LANUSSE P; SLODZIAN G et al.1972; RECH. AEROSPAT.; FR.; DA. 1972; NO 6; PP. 313-324; ABS. ANGL.; BIBL. 14 REF.Serial Issue

MECHANISM OF OXYGEN EFFECT ON SECONDARY ION EMISSION OF TANTALUMDOROZHKIN AA; KOVARSKIJ AP.1981; ZH. TEKH. FIZ.; SUN; DA. 1981-04; VOL. 51; NO 4; PP. 833-835; BIBL. 7 REF.Article

SURFACE OBSERVATION BY MEANS OF OSEE DETECTIONMIZUHARA K.1981; NIPPON KINZOKU GAKKAISHI (1952); ISSN 0021-4876; JPN; DA. 1981; VOL. 45; NO 7; PP. 691-697; ABS. ENG; BIBL. 13 REF.Article

DETECTION D'UN FAISCEAU FAIBLE DE PARTICULES PAR EMISSION SECONDAIRE INSTRUMENTATION ELECTRONIQUE ASSOCIEEAUSSET PATRICK.1980; ; FRA; DA. 1980; 139 P.; 30 CM; BIBL. 46 REF.; TH. 3E CYCLE: PHYS., ELECTRON./PARIS 6/1980Thesis

SECONDARY COMPLEX ION EMISSION (REVIEW)VASIL'EV MA; KOSYACHKOZ AA; NEMOSHKALENKO IN et al.1979; METALLOFIZIKA; UKR; DA. 1979; VOL. 1; NO 2; PP. 103-113; BIBL. 26 REF.Article

INSTALLATION POUR L'ENREGISTREMENT AUTOMATIQUE DU COEFFICIENT D'EMISSION ELECTRONIQUE SECONDAIRE DES MATERIAUX METALLIQUESSAVITSKIJ EM; BUROV IV; KAPUSTIN VI et al.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 2; PP. 169-171; BIBL. 8 REF.Article

ON THE QUANTUM THEORY OF THE EMISSION OF SECONDARY IONSANTAL J.1976; PHYS. LETTERS, A; NETHERL.; DA. 1976; VOL. 55; NO 8; PP. 493-494; BIBL. 9 REF.Article

THE KVV AUGER SPECTRUM OF LITHIUM METAL.JACKSON AJ; TATE C; GALLON TE et al.1975; J. PHYS., F; G.B.; DA. 1975; VOL. 5; NO 2; PP. 363-374; BIBL. 25 REF.Article

DETERMINATION DE LA PROFONDEUR D'ORIGINE D'ELECTRONS SECONDAIRES VRAIS DANS L'OR ET L'ALUMINIUM.NOIRAY JC; BINDI R; LANTERI H et al.1974; THIN SOLID FILMS; NETHERL.; DA. 1974; VOL. 23; NO 1; PP. 63-73; ABS. ANGL.; BIBL. 15 REF.Article

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